中國醫藥大學機構典藏 China Medical University Repository, Taiwan:Item 310903500/28908
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 29490/55136 (53%)
造访人次 : 1998066      在线人数 : 446
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻
    主页登入上传说明关于CMUR管理 到手机版


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://ir.cmu.edu.tw/ir/handle/310903500/28908


    题名: Binary liquid solutions exhibiting minimum flash-point behavior
    作者: Liaw, HJ;Lee, TP;Tsai, JS;Hsiao, WH;Chen, MH;Hsu, TT
    贡献者: 公共衛生學院職安系;China Med Coll, Dept Occupat Safety & Hlth, Taichung, Taiwan
    日期: 2003
    上传时间: 2010-09-24 14:00:53 (UTC+8)
    出版者: ELSEVIER SCI LTD
    摘要: Effective diffusion coefficients for the permeation of several organic solvents through nitrile Gloves were experimentally investigated using the American Society for Testing and Materials (ASTM) F-739 test cell method. Fick's effective diffusion coefficients for benzene, toluene, ethyl benzene, xylene, and styrene were estimated to be 0.61 +/- 0.02, 0.50 +/- 0.06,0.27 +/- 0.02, 0.31 +/- 0.03, and 0.21 +/- 0.03 (x 10(-6) cm(2)/s), respectively. These results were comparable to results found by others using different permeation models. Using a transient mass diffusion equation and appropriate initial and boundary conditions, the effective diffusion coefficients were found to adequately simulate the concentration profiles of the organic solvents in the collection chamber during the permeation test. The effective diffusion coefficients were found to be inversely correlated to the molecular weight of the compounds. The results of this study can be used to estimate the exposure to workers using nitrile gloves. (C) 2003 Elsevier Science B.V. All rights reserved.
    關聯: JOURNAL OF LOSS PREVENTION IN THE PROCESS INDUSTRIES 16(3):173-186
    显示于类别:[醫務管理學系暨碩士班] 期刊論文

    文件中的档案:

    没有与此文件相关的档案.



    在CMUR中所有的数据项都受到原著作权保护.

    TAIR相关文章

     


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回馈